X-ray Powder Diffraction

X-ray diffraction (XRD) is used for polycrystalline material analysis. The instrument uses the classic Bragg-Brentano configuration to obtain data for qualitative and quantitative crystalline phase identification, crystallinity determination and structure investigations When a parallel beam of X-rays is directed upon a crystalline material the crystal planes will diffract the beam to form an interference pattern. For constructive interference, the interplanar spacing relates to the incident X-rays according to the Bragg equation: 2d.sinθ = nλ. By varying the diffraction angle 2θ this method generates an X-ray diffraction pattern consisting of a series of sharp peaks of differing intensity. The 2θ angle at which a peak occurs corresponds to a particular interplanar spacing of the crystalline content of the material.